Conditions Extrêmes et Matériaux : Haute Température et Irradiation
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2000
ACLN
doi
R.Revel, D.Bazin, M.Gailhanou, S.Lefevre, Y.Kihn, D.Massiot
,
'Aspects complémentaires entre la spectroscopie d'absroption X et la diffraction anomale dans le cas d'entités de taille nanométrique supportées sur un oxyde léger.'
, J. Phys. IV 10 289-297 (2000) doi:
10.1051/jp4:20001032