Conditions Extrêmes et Matériaux : Haute Température et Irradiation
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Group by   8 records found
ACL

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Y.El Mendili, A.Vaitkus, A.Merkys, S.Grazulis, D.Chateigner, F.Mathevet, S.Gascoin, S.Petit, J-F.Bardeau, M.Zanatta, M.Secchi, G.Mariotto, A.Kumar, M.Cassetta, L.Lutterotti, E.Borovin, B.Orberger, P.Simon, B.Hehlen, M.Le Guen, 'Raman Open Database: first interconnected Raman-XRD open-access resource for material identification', J. Appl. Crystallogr., 52 618-625 (2019) doi:10.1107/s1600576719004229 - 24 citations (WoS)

ACL

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S.Liu, G.Zhang, S.Wan, J.L.You, M.R.Ammar, A.Canizarès, P.Simon, Y.Wu, 'High-temperature Raman spectroscopy of the Cs2O-B2O3-MoO3 system for CsB3O5 crystal growth', J. Appl. Crystallogr., 49 479-484 (2016) doi:10.1107/s160057671600114x - 4 citations (WoS)

ACL

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D.Bazin, M.Daudon, G.André, R.Weil, E.Véron, G.Matzen, 'Therapy modifies cystine kidney stones at the macroscopic scale. Do such alterations exist at the mesoscopic and nanometre scale?', J. Appl. Crystallogr., 47 719-725 (2014) doi:10.1107/s1600576714004658 - 28 citations (WoS)

ACL

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L.Braconnier, I.Clémençon, C.Legens, V.Moizan, F.Diehl, H.Pillière, P.Echegut, D.De Sousa Meneses, Y.Schuurman, 'An X-ray diffractometer coupled with diffuse reflectance infrared Fourier transform spectroscopy and gas chromatography for in situ and in operando characterization: an innovative analytical laboratory instrument', J. Appl. Crystallogr., 46 262–266 (2013) doi:10.1107/s0021889812042781 - 7 citations (WoS)

ACL

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M.Allix, M.D.Alba, P.Florian, A.J.Fernandez-Carrion, M.R.Suchomel, A.Escudero, E.Suarde, A.I.Becerroc, 'Structural elucidation of b-(Y,Sc)2Si2O7: combined use of 89Y MAS NMR and powder diffraction', J. Appl. Crystallogr., 44 846-852 (2011) doi:10.1107/s0021889811021303 - 12 citations (WoS)

ACL

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M.Daudon, D.Bazin, G.André, P.Jungers, A.Cousson, P.Chevallier, E.Véron, G.Matzen, 'Examination of whewellite kidney stones by scanning electron microscopy and powder neutron diffraction techniques', J. Appl. Crystallogr., 42 109-115 (2009) doi:10.1107/s0021889808041277 - 85 citations (WoS)

ACL

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E.Cattaruzza, F.D'acapito, F.Gonella, A.Longo, A.Martorana, G.Mattei, C.Maurizio, D.Thiaudière, 'GISAXS study of Cu-Ni alloy clusters obtained by double ion implantation in silicate glasses', J. Appl. Crystallogr., 33 740-743 (2000) doi:10.1107/s0021889800099878

ACL

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D.Babonneau, A.Naudon, D.Thiaudière, S.Lequien, 'Morphological characterization of ion-sputtered C-Ag, C/C-Ag and Ag/C films by GISAXS', J. Appl. Crystallogr., 32 226-233 (1999) doi:10.1107/s0021889898011996