Conditions Extrêmes et Matériaux : Haute Température et Irradiation
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Group by   16 records found
12
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Maxime Puyo, Konstantina Christina Topka, Babacar Diallo, Raphaël Laloo, Cécile Genevois, Pierre Florian, Thierry Sauvage, Diane Samelor, François Senocq, Hugues Vergnes, Brigitte Caussat, Marie-Joëlle Menu, Nadia Pellerin, Constantin Vahlas, Viviane Turq, 'Beyond surface nanoindentation: Combining static and dynamic nanoindentation to assess intrinsic mechanical properties of chemical vapor deposition amorphous silicon oxide (SiOx) and silicon oxycarbide (SiOxCy) thin films', Thin Solid Films, 735 138844 (2021) doi:10.1016/j.tsf.2021.138844

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N.Jaber, J.Wolfman, C.Daumont, B.Negulescu, A.Ruyter, T.Sauvage, B.Courtois, H.Bouyanfif, J.L.Longuet, C.Autret-Lambert, F.Gervais, 'Laser fluence and spot size effect on compositional and structural properties of BiFeO 3 thin films grown by Pulsed Laser Deposition', Thin Solid Films, 634 107-111 (2017) doi:10.1016/j.tsf.2017.05.003 - 12 citations (WoS)

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A.Sediri, M.Zaghrioui, A.Barichard, C.Autret, B.Negulescu, L.del Campo, P.Echegut, P.Laffez, 'Growth of polycrystalline Pr2NiO4+δ coating on alumina substrate by RF magnetron co-sputtering from composite targets', Thin Solid Films, 600 131-135 (2016) doi:10.1016/j.tsf.2016.01.023 - 4 citations (WoS)

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E.Le Boulbar, E.Millon, C.Boulmer-Leborgne, C.Cachoncinlle, B.Hakim, E.Ntsoenzok, 'Optical properties of rare earth-doped TiO2 anatase and rutile thin films grown by pulsed-laser deposition', Thin Solid Films, 553 13-16 (2014) doi:10.1016/j.tsf.2013.11.032 - 30 citations (WoS)

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A.Anokhin, O.A Bunina, Y.I.Golovko, V.M.Mukhortov, Y.I.Yuzyuk, P.Simon, 'Raman and X-ray diffraction study of (Ba,Sr)TiO3/(Bi,Nd)FeO3 multilayer heterostructures', Thin Solid Films, 545 267-271 (2013) doi:10.1016/j.tsf.2013.08.057 - 3 citations (WoS)

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A.L.Thomann, P.A.Cormier, V.Dolique, N.Semmar, R.Dussart, T.Lecas, B.Courtois, P.Brault, 'Energy transferred to the substrate surface during reactive magnetron sputtering of aluminum in Ar/O2 atmosphere', Thin Solid Films, 539 88-95 (2013) doi:10.1016/j.tsf.2013.05.075 - 17 citations (WoS)

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P.Němec, J.Charrier, M.Cathelinaud, M.Allix, J.L.Adam, S.Zhang, V.Nazabal, 'Pulsed laser deposited amorphous chalcogenide and alumino-silicate thin films and their multilayered structures for photonic applications', Thin Solid Films, 539 226-232 (2013) doi:10.1016/j.tsf.2013.04.013 - 16 citations (WoS)

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P.Nemec, V.Nazabal, J.Vavra, J.P.Guin, D.Vesely, A.Kalendova, M.Allix, S.Zhang, C.Drasar, 'Pulsed laser deposited alumino-silicate thin films and amorphous chalcogenide/alumino-silicate structures', Thin Solid Films, 519 1341-1345 (2010) doi:10.1016/j.tsf.2010.09.050 - 6 citations (WoS)

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A.Naas, D.De Sousa Meneses, B.Hakim, G.Regula, M.F.Beaufort, A.Belaidi, E.Ntsoenzok, 'Optical and nuclear characterization of Xe-induced nanoporosity in SiO2', Thin Solid Films, 518 4721-4725 (2010) doi:10.1016/j.tsf.2009.12.068

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M.Xu, G.Regula, R.Daineche, E.Oliviero, B.Hakim, E.Ntsoenzok, B.Pichaud, 'Effect of Si and He implantation in the formation of ultra shallow junctions in Si', Thin Solid Films, 518 2354-2356 (2010) doi:10.1016/j.tsf.2009.09.153 - 1 citations (WoS)

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