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RAMAN imagery
See our list of publications
introduction
these very versatile high resolution spectrometers, with its excellent spectral stability,
allows accurate surface and volume cartography on sample at room temperature and at high temperature.
Multivariate statistical analysis is a powerful tool for cartography analysis (composed of a huge number of individual
spectra, up to a million)
The new UV dedicated Qontor system allows higher temperature analysis
InVia Qontor set-up
The sample can be excited thanks to one of the 5 wavelength delivered by three lasers :
Resolution can be fitted to the sample studied thanks to a set of 5 gratings
the sample analyzed size will be determined by the microscope objective power. We can choose between :
5x Leica objective, NA=0,12 / WD=14mm / LR=1,5µm / AR=140µm 20x Leica objective, NA=0,40 / WD=1,15mm / LR=0,8µm / AR=12,5 µm 50x Leica objective, NA=0,75 / WD=0,37mm / LR=5,1µm / AR=3,6µm 100x Leica objective, NA=0,85 / WD=0,33mm / LR=0,7µm / AR=2,8µm 40x Thorlabs, NA=0,50 / WD=1mm 15x Thorlabs, NA=0,32 / WD=8mm
InVia Reflex set-up
The sample can be excited thanks to one of the 5 wavelength delivered by three lasers :
Resolution can be fitted to the sample studied thanks to a set of 5 gratings
600 lines/mm, one blazed in Ar/Kr region, the other one in red/IR region 1200 lines/mm blazed in red/IR region 1800 lines/mm 2400 lines/mm blazed in Ar/Kr region
the sample analyzed size will be determined by the microscope objective power. We can choose between :
5x Leica objective, NA=0,12 / WD=14mm / LR=1,5µm / AR=140µm 20x Leica objective, NA=0,40 / WD=1,15mm / LR=0,8µm / AR=12,5 µm 50x Leica objective, NA=0,75 / WD=0,37mm / LR=5,1µm / AR=3,6µm 100x Leica objective, NA=0,85 / WD=0,33mm / LR=0,7µm / AR=2,8µm 50x Olympus objective, NA=0,28 / WD=10mm
NA stands for numerical aperture,WD for working distance; AR for axial resolution and LR for lateral one
page créée et maintenue par Aurélien Canizarès
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