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2003
ACL
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C.Ferrero, M.Servidori, D.Thiaudière, S.Milita, S.Lequien, S.Sama, S.Setzu, T.H.Metzger, 'Depth Profiling of the Lateral Pore Size and Correlation Distance in Thin Porous Silicon Layers by Grazing Incidence Small Angle X-Ray Scattering', J. Electrochem. Soc., 150 E366-E370 (2003) doi:10.1149/1.1582465
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