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2005
ACL
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F.Berberich, H.Graasfma, B.Rousseau, A.Canizarès, R.Ramy-Ratiarison, N.Raimboux, P.Simon, P.Odier, N.Mestres, T.Puig, X.Obradors, 'Combined synchrotron XRD and ì-Raman for following in situ the growth of solution deposited YBa2Cu3O7 thin films.', J. Mater. Research 20 3270-3273 (2005) doi:10.1557/jmr.2005.0421
A unique combination of in situ synchrotron x-ray diffraction and in situ micro-Raman spectroscopy was used to study the growth process of YBa2Cu3O6+x films obtained by metal organic decomposition using trifluoroacetate precursor on LaAlO3 substrates. The techniques give complementary information: x-ray diffraction gives insight into the structural growth, whereas micro-Raman spectroscopy gives information of the chemical composition with additional information on the texture. To perform both experiments in situ, a special high-temperature process chamber was designed.
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