2000
ACL
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R.El Bouayadi, G.Regula, B.Pichaud, M.Lancin, C.Dubois, E.Ntsoenzok, 'Gettering of diffused Au and of Cu and Ni contamination in silicon by cavities induced by high energy He implantation', Phys. Stat. Solidi B 222 319-326 (2000) doi:10.1002/1521-3951(200011)222:1<319::aid-pssb319>3.0.co;2-q
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