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M.F.Beaufort, E.Oliviero, H.Garem, S.Godey, E.Ntsoenzok, C.Blanchard, J.F.Barbot, 'Defects in silicon induced by high energy helium implantation and their evolution during anneals', Philos. Mag. B 80 1975-1985 (2000) doi:10.1080/13642810008216520
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