Conditions Extrêmes et Matériaux : Haute Température et Irradiation
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2005
ACL
doi
S.Dourdain, J.F.Bardeau, M.Dutreilh-Colas, B.Smarsly, A.Medhi, B.M.Ocko, A.Gibaud
,
'Determination by X-Ray reflectivity and small angle x-ray scattering of the porous properties of mesoporous silica thin films'
, Appl. Phys. Lett. 86 113108 (2005) doi:
10.1063/1.1887821