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2008
ACL
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L.Liszkay, C.Corbel, P Perez, P.Desgardin, M.F.Barthe, T.Ohdaira, R.Suzuki, M.Etienne, A.Walcarius, P.Crivelli, A.Rubbia, 'Positronium reemission yield from mesostructured silica films', Appl. Phys. Lett. 92 063114 (2008) doi:10.1063/1.2844888
The reemission yield of ortho-positronium o-Ps into vacuum outside mesoporous silica films on glass is measured in reflection mode with a specially designed lifetime LT spectrometer. Values as high as 40% are found. The intensity of the 142 ns vacuum LT is recorded as a function of reemission depth. The LT depth profiling is correlated to the 2 and 3 energy ones to determine the annihilation characteristics inside the films. Positron lifetime in capped films is used to determine the pore size. For the first time, a set of consistent fingerprints for positronium annihilation, o-Ps reemission into vacuum, and pore size, is directly determined in surfactant-templated mesoporous silica films.
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