Conditions Extrêmes et Matériaux : Haute Température et Irradiation
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Faisceaux de particules
Application of Ion Beams

Responsable : Thierry Sauvage / List of Publications...

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A Hollingsworth, M.F.Barthe, M Lavrentiev, P Derlet, S Dudarev, D Mason, Z Hu, P Desgardin, J Hess, S Davies, B Thomas, H Salter, E Shelton, K Heinola, K Mizohata, A de Backer, A Baron-Wiechec, I Jepu, Y Zayachuk, A Widdowson, E Meslin, A Morellec, 'Comparative study of deuterium retention and vacancy content of self-ion irradiated tungsten', J. Nucl. Mater., 558 153373 (2022) doi:10.1016/j.jnucmat.2021.153373 - 1 citations (WoS)

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Konstantina Christina Topka, Hugues Vergnes, Tryfon Tsiros, Paris Papavasileiou, Laura Decosterd, Babacar Diallo, François Senocq, Diane Samelor, Nadia Pellerin, Marie-Joëlle Menu, Constantin Vahlas, Brigitte Caussat, 'An innovative kinetic model allows insight in the moderate temperature chemical vapor deposition of silicon oxynitride films from tris(dimethylsilyl)amine', Chem. Eng. J., 431 133350 (2022) doi:10.1016/j.cej.2021.133350

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Konstantina Christina Topka, Babacar Diallo, Maxime Puyo, Paris Papavasileiou, Charlotte Lebesgue, Cecile Genevois, Yann Tison, Cedric Charvillat, Diane Samelor, Raphael Laloo, Daniel Sadowski, François Senocq, Thierry Sauvage, Hugues Vergnes, Marie-Joelle Menu, Brigitte Caussat, Viviane Turq, Nadia Pellerin, Constantin Vahlas, 'Critical level of nitrogen incorporation in silicon oxynitride films : transition of structure and properties, towards enhanced anticorrosion performance', ACS Appl. Electron. Mater., 4 1741-1755 (2022) doi:10.1021/acsaelm.2c00018

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M.Gerardin, E.Gilabert, D.Horlait, M.F.Barthe, G.Carlot, 'Experimental study of the diffusion of Xe and Kr implanted at low concentrations in UO2 and determination of their trapping mechanisms', J. Nucl. Mater., 556 153174 (2021) doi:10.1016/j.jnucmat.2021.153174

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Z.Hu, P.Desgardin, C.Genevois, J.Joseph, B.Décamps, R.Schäublin, M.F.Barthe, 'Effect of purity on the vacancy defects induced in self–irradiated tungsten: A combination of PAS and TEM', J. Nucl. Mater., 556 153175 (2021) doi:10.1016/j.jnucmat.2021.153175

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B.Diallo, K.C.Topka, Maxime Puyo, C.Lebesgue, C.Genevois, R.Laloo, Diane Samelor, H.Lecoq, M.Allix, H.Vergnes, F.Senocq, P.Florian, V.Sarou-Kanian, T.Sauvage, M.-J.Menu, B.Caussat, V.Turq, C.Vahlas, N.Pellerin, 'Network hydration, ordering and composition interplay of chemical vapor deposited amorphous silica films from tetraethyl orthosilicate', J. Mat. Res. Technol., 13 534-547 (2021) doi:10.1016/j.jmrt.2021.04.067 - 2 citations (WoS)

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Maxime Puyo, Konstantina Christina Topka, Babacar Diallo, Raphaël Laloo, Cécile Genevois, Pierre Florian, Thierry Sauvage, Diane Samelor, François Senocq, Hugues Vergnes, Brigitte Caussat, Marie-Joëlle Menu, Nadia Pellerin, Constantin Vahlas, Viviane Turq, 'Beyond surface nanoindentation: Combining static and dynamic nanoindentation to assess intrinsic mechanical properties of chemical vapor deposition amorphous silicon oxide (SiOx) and silicon oxycarbide (SiOxCy) thin films', Thin Solid Films, 735 138844 (2021) doi:10.1016/j.tsf.2021.138844

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Sara Ibrahim, Fatima Zahrae Lahboub, Pascal Brault, Agnès Petit, Amaël Caillard, Eric Millon, Thierry Sauvage, Asunción Fernández, Anne-Lise Thomann, 'Influence of helium incorporation on growth process and properties of aluminum thin films deposited by DC magnetron sputtering', Surf. Coat. Technol., 426 127808 (2021) doi:10.1016/j.surfcoat.2021.127808

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Eva Kovacevic, Thomas Strunskus, Neelakandan M.Santhosh, Janez Zavašnik, Wolfgang E.S.Unger, Thierry Sauvage, Mohamed-Ramzi Ammar, Uroš Cvelbar, Johannes Berndt, 'Thermal stability studies of plasma deposited hydrogenated carbon nitride nanostructures', Carbon, 184 82-90 (2021) doi:10.1016/j.carbon.2021.08.008

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Clément Bessouet, Sylvain Lemettre, Charlotte Kutyla, Alain Bosseboeuf, Philippe Coste, Thierry Sauvage, Hélène Lecoq, Olivier Wendling, Aurélien Bellamy, Piyush Jagtap, Stéphanie Escoubas, Christophe Guichet, Olivier Thomas, Johan Moulin, 'Electrical and ion beam analyses of yttrium and yttrium-titanium getter thin films oxidation', Journal of Vacuum Science & Technology B, 39 054202 (2021) doi:10.1116/6.0001084 - 1 citations (WoS)

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